X-Ray Diffractometer (XRD)
D8 ADVANCE
X-ray diffraction is based on constructive interference of monochromatic X-rays and a crystalline sample at different angles. The X-ray diffraction angle depends on the composition and structure of the substance present in the sample. The obtained information can indicate the type of compound contained in the sample and can be used to study the structure of the crystals of the sample
Specifications
- Phase identification, quantitative phase analysis, micro-structure and crystal structure analysis, residual stress and texture investigations, X-ray reflectometry, and micro-diffraction
- Best powder XRD performance with push-button switching to amorphous and polycrystalline thin-film analysis under ambient and non-ambient conditions.
- 9 position auto sample changer