X-ray diffraction-based technique where a narrow collimated beam of X-rays is focused onto a sample and the scattered X-rays recorded by a detector. The pattern of the scattered X-rays carries information on the molecular structure of the material
Specifications
Determine in verities mode; SAXS / WAXS / GISAXS
Provide testing in temperature range; -150 °C to 500 °C, ± 0.1 °C
Determine particle shape, particle size and size distribution , internal structure , crystallinity,