A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample’s surface, morphology, topography, measurement size and composition.
|Electron Optics: Emitter||ZrO / W Schottky emitter, Acceleration Voltage: 0.1-30 kV (0.1 kV step)|
|Variable Pressure Mode||Low vacuum mode Pressure Range 10-300 Pa|
|Detectors||Top detector, Lower detector, Ultra Variable-Pressure Detector (UVD), Backscatter Electron Detector(BSE), Energy Dispersive X-ray detector (EDS)|
|Type of sample||Solid, powder, thin film, nanoparticles, polymer, Fiber , biomaterial with coating Au, Pt, biological sample, non-conductive materials|